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Cargando... Characterization and Metrology for Nanoelectronics: 2007 International Conference on Frontiers of Characterization and Mpor David G. Seiler
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This book contains peer-reviewed papers presented at the 2007 International Conference on Frontiers of Characterization and Metrology. It emphasizes the frontiers of innovation in the characterization and metrology needed to advance nanoelectronics. It provides an effective portrayal of the industry’s characterization and metrology needs and how they are being addressed. It also offers a foundation for further advances in metrology and new ideas for research and development. No se han encontrado descripciones de biblioteca. |
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Google Books — Cargando... GénerosSistema Decimal Melvil (DDC)621.3815Technology Engineering and allied operations Applied physics Electrical, magnetic, optical, communications, computer engineering; electronics, lighting Electronics, communications engineering ElectronicsClasificación de la Biblioteca del CongresoValoraciónPromedio: No hay valoraciones.¿Eres tú?Conviértete en un Autor de LibraryThing. |